• Both devices can be used to view microstructures and are able to characterize surface morphology and particle size or for elemental analysis in composite (EDS)
  • Scanning transmission electron microscopy (STEM) combines two principles: transmission electron microscopy and scanning electron microscopy.
  • One of the principal advantages over TEM is the fact that STEM unlocks the possibility to perform SEM and STEM sample characterization in the same location on the sample and it enables the use of other types of signal which cannot be spatially correlated in TEM, including secondary electrons, scattered beam electrons and characteristic X-rays.
  • The STEM offers significant benefits in dark field operation with an unique imaging mode, High Angle Annular Dark Field (HAADF) imaging.
  • SEM and STEM also provides a 3-dimensional image a sample.