DESCRIPTION:
Coupled with the R9 – RHK Controller which has various auxiliary I/O signal ports for customized experiments (including ultra-low noise inputs), 2 integrated lock-in amplifiers and one PLL, our Home-Built AFM Head is suitable for various AFM techniques, such as:
- Topography/Lateral Force/Phase Imaging
- Atomic Resolution Imaging
- Conductive AFM Imaging
- Scanning Polarization Force Microscopy (AC and DC)
- Kelvin Probe Force Microscopy
- AFM Spectroscopy (F-z Curves and I – V curves)
The AFM system is equipped with an enclosure for acoustic/electrostatic insulation and for controlled atmosphere (humidity, gas, etc.)
Atmospheric pressure
Room temperature Image made by viewing friction mode Stick-slip motion of the tip over the atomic lattice |
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High resolution imaging of mica sample. |