English
Română (Romanian)Scanning Electron Microscope
Scanning Transmission Electron Microscope – Energy Dispersive X-ray Analysis (STEM-EDX system)
Focused Ion Beam – Scanning Electron Microscopy – Energy Dispersive X-ray Analysis (FIB-SEM-EDX system)
- Carbon based nanomaterials synthesis
- Specimens Preparation
- Advanced Electronic Microscopy
- Advanced Atomic Force Microscopy
- Micro-Raman, nano-optics and nano-spectroscopy
- Structural and Chemical Characterization
- Mass Spectrometry
- Spectroscopy
- Electrochemical micro- and nanostructured coatings
- Thin Films
- Micro and Nanolithography
- Electrical, Optical and Magnetic measurements at low temperature
- Solar cells, MEMS and chip evaluation and testing