XRF

 

DESCRIPTION:

• Allows coating thickness (single / multi-layer) and elemental composition measurements based on X-ray fluorescence (XRF)
• Allows elemental composition measurements for liquid samples
  easy to use, fast and non-destructive analysis
• Elemental range from 13Al to 92U
• Superior resolution and high efficiency SDD (Silicon Drift Detector) detector offers optimal efficiency at all energy levels with improved limits of detection (LOD), thus being possible to measure the thinnest coatings and element composition at trace level.
• Micro-focus Be window X-ray tube combines high precision analysis, shorter measurement times with field proven high reliability and outstanding lifetime
• Giant slotted chamber design with Motorized Z Travel and Programmable XY Stage, with generous interior volume facilitates the analysis of standard and oversized samples.