Topography Study of SWCNTs via AFM

2D AFM Topography images of SWCNTs: a) 30 x 30 μm; b) 10 x 10 μm; c) 3 x 3 μm

Topography Study of NiO films via AFM

5×5 µm2 AFM Topography images of NiO/Glass with 250 nm thicknesses,
deposited at different RF powers
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